Title :
A spectrum domain Kirchhoff scattering model for randomly rough surface
Author :
Liu, Ning ; Li, Zong-Qian ; Weng, Hai-Xiao
Author_Institution :
Dept. of Electron. Eng., Tsinghua Univ., Beijing, China
fDate :
6/21/1905 12:00:00 AM
Abstract :
This paper constructs a randomly rough surface via the Fourier series of the surface height function and analyzes the statistical characteristics of the Fourier coefficients. Using this expression of spectrum domain, a different type of the Kirchhoff model named the spectrum domain Kirchhoff model (SDKM) is obtained to calculate the scattering coefficient. Comparison between SDKM and the original Kirchhoff model shows that the SDKM has obvious advantages.
Keywords :
Fourier series; electromagnetic wave scattering; rough surfaces; spectral-domain analysis; statistical analysis; Fourier coefficients; Fourier series; SDKM; randomly rough surface; scattering coefficient; spectrum domain Kirchhoff model; spectrum domain Kirchhoff scattering model; statistical characteristics; surface height function; Autocorrelation; Image sampling; Kirchhoff´s Law; Radar scattering; Rough surfaces; Scanning probe microscopy; Sea surface; Stochastic processes; Surface roughness; Surface waves;
Conference_Titel :
Computational Electromagnetics and Its Applications, 1999. Proceedings. (ICCEA '99) 1999 International Conference on
Print_ISBN :
0-7803-5802-3
DOI :
10.1109/ICCEA.1999.825058
