A spectrum domain Kirchhoff scattering model for randomly rough surface

Author

Liu, Ning ; Li, Zong-Qian ; Weng, Hai-Xiao

Author_Institution

Dept. of Electron. Eng., Tsinghua Univ., Beijing, China

fYear

1999

fDate

6/21/1905 12:00:00 AM

Firstpage

24

Lastpage

27

Abstract

This paper constructs a randomly rough surface via the Fourier series of the surface height function and analyzes the statistical characteristics of the Fourier coefficients. Using this expression of spectrum domain, a different type of the Kirchhoff model named the spectrum domain Kirchhoff model (SDKM) is obtained to calculate the scattering coefficient. Comparison between SDKM and the original Kirchhoff model shows that the SDKM has obvious advantages.

Keywords

Fourier series; electromagnetic wave scattering; rough surfaces; spectral-domain analysis; statistical analysis; Fourier coefficients; Fourier series; SDKM; randomly rough surface; scattering coefficient; spectrum domain Kirchhoff model; spectrum domain Kirchhoff scattering model; statistical characteristics; surface height function; Autocorrelation; Image sampling; Kirchhoff´s Law; Radar scattering; Rough surfaces; Scanning probe microscopy; Sea surface; Stochastic processes; Surface roughness; Surface waves;

fLanguage

English

Publisher

ieee

Conference_Titel

Computational Electromagnetics and Its Applications, 1999. Proceedings. (ICCEA '99) 1999 International Conference on

Print_ISBN

0-7803-5802-3

Type

conf

DOI

10.1109/ICCEA.1999.825058

Filename

825058