Title :
Detection of ultrasonic flaw signals using wavelet transform techniques
Author :
Xin, J. ; Murthy, R. ; Li, X. ; Bilgutay, N.M.
Author_Institution :
Dept. of Electr. & Comput. Eng., Drexel Univ., Philadelphia, PA, USA
Abstract :
Ultrasonic detection and identification of flaws embedded in large-grained materials is often limited by the presence of high amplitude interfering echoes due to unresolvable grain boundaries. The split spectrum processing (SSP) technique using nonlinear algorithms is very effective in grain noise suppression and flaw detection. The wavelet transform technique is used to perform spectral decomposition, followed by the application of various nonlinear algorithms to obtain the output signal. The wavelet transform is based on the principle of constant Q or constant relative bandwidth frequency. Experimental results for the constant-Q SSP technique are presented. The experimental data indicate improved performance in identifying and extracting multiple targets compared to the conventional fixed bandwidth SSP
Keywords :
flaw detection; ultrasonic materials testing; wavelet transforms; constant relative bandwidth frequency; interfering echoes; large-grained materials; multiple targets; nonlinear algorithms; spectral decomposition; split spectrum processing; ultrasonic flaw signals; unresolvable grain boundaries; wavelet transform techniques; Background noise; Band pass filters; Bandwidth; Frequency diversity; Grain boundaries; Narrowband; Nondestructive testing; Signal processing; Signal resolution; Wavelet transforms;
Conference_Titel :
Ultrasonics Symposium, 1992. Proceedings., IEEE 1992
Conference_Location :
Tucson, AZ
Print_ISBN :
0-7803-0562-0
DOI :
10.1109/ULTSYM.1992.275883