DocumentCode :
1655615
Title :
Design Verification and Measurement Techniques for UHF RFID Tag IC
Author :
Xu, Kai ; Mao, Luhong ; Wang, Zheng ; Chen, Liying ; Xie, Sheng ; Zhang, Shilin
Author_Institution :
Sch. of Electron. & Inf. Eng., Tianjin Univ., Tianjin, China
fYear :
2011
Firstpage :
1
Lastpage :
5
Abstract :
Ultra High Frequency (UHF) Radio Frequency Identification (RFID) technology is growing rapidly in recent years. Passive tag is one of the most important components that construct the UHF RFID system. This paper presents the design verification and measurement techniques for UHF RFID tag IC, which can meet the designers´ demands for verification and test purposes at low cost. A baseband verification platform based on Field Programmable Gate Array (FPGA) is introduced at first. The proposed instrument can be used to test the function of the tag´s baseband processor at early phase. It can also help designers with Hardware Description Language (HDL) code debugging and, therefore, improves the reliability of the design before tape-out. For the purpose of RF measurements, a novel approach based on commercial reader, tunable attenuator, and directional couplers is presented. This method precludes the need for high-end RFID tester when measuring the sensitivity and impedance of a tag chip. The measured results are critical for tag antenna design. Applying the techniques mentioned above, our fabricated tag chips are tested. And a dipole antenna is designed for tag assembly.
Keywords :
UHF couplers; UHF integrated circuits; UHF measurement; field programmable gate arrays; hardware description languages; integrated circuit reliability; radiofrequency identification; FPGA; HDL code debugging; UHF RFID tag IC; UHF measurement techniques; baseband verification platform; commercial reader; dipole antenna; directional couplers; field programmable gate array; hardware description language code debugging; high-end RFID tester; passive tag; sensitivity measurement; tag antenna design; tunable attenuator; ultrahigh frequency radio frequency identification technology; Antenna measurements; Baseband; Integrated circuits; Radio frequency; Radiofrequency identification; Semiconductor device measurement; Sensitivity;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Wireless Communications, Networking and Mobile Computing (WiCOM), 2011 7th International Conference on
Conference_Location :
Wuhan
ISSN :
2161-9646
Print_ISBN :
978-1-4244-6250-6
Type :
conf
DOI :
10.1109/wicom.2011.6040561
Filename :
6040561
Link To Document :
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