DocumentCode
1655715
Title
Dynamic read destructive fault in embedded-SRAMs: analysis and march test solution
Author
Dilillo, Luigi ; Girard, Patrick ; Pravossoudovitch, Serge ; Virazel, Arnaud ; Borri, Simone ; Hage-Hassan, Magali
Author_Institution
Universite de Montpellier II
fYear
2004
Firstpage
140
Lastpage
145
Keywords
Change detection algorithms; Circuit faults; Fault detection; Random access memory; Robots; Silicon; Stress; System-on-a-chip; Testing; Uniform resource locators;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium, 2004. ETS 2004. Proceedings. Ninth IEEE European
Print_ISBN
0-7695-2119-3
Type
conf
DOI
10.1109/ETSYM.2004.1347645
Filename
1347645
Link To Document