• DocumentCode
    1655760
  • Title

    Analysis of field in a symmetric TEM cell by FEM

  • Author

    Malathi, K. ; Das, Annapurna

  • Author_Institution
    Sch. of ECE, Anna Univ., Madras, India
  • fYear
    2002
  • fDate
    6/24/1905 12:00:00 AM
  • Firstpage
    49
  • Lastpage
    53
  • Abstract
    The field distribution inside the symmetric transverse electromagnetic (TEM) cell is analyzed by finite element method (FEM). Poisson´s equation is solved to obtain the potential distribution in the cross section. The horizontal and vertical components of the electric field are computed from the gradient of the solution. The field variation below the septum are computed and their variations are plotted. The uniform region of the vertical component of electric field is found and isolation of the horizontal component of electric field is determined.. This proves that in the region below the septum the TEM cell supports uniform transverse electromagnetic (TEM) field, which is a requirement for testing the susceptibility levels of electronic equipment.
  • Keywords
    Poisson equation; electric fields; electromagnetic compatibility; electronic equipment testing; finite element analysis; test facilities; EMC measurements; FEM; Poisson´s equation; electric field; electronic equipment susceptibility levels testing; field distribution; finite element method; horizontal components; potential distribution; symmetric TEM cell; symmetric transverse electromagnetic cell; vertical components; Boundary conditions; Coaxial components; Educational institutions; Electromagnetic analysis; Electromagnetic fields; Electronic equipment testing; Finite element methods; Integral equations; Poisson equations; TEM cells;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Interference and Compatibility, 2001/02. Proceedings of the International Conference on
  • Print_ISBN
    0-7803-7563-7
  • Type

    conf

  • DOI
    10.1109/ICEMIC.2002.1006461
  • Filename
    1006461