• DocumentCode
    1655774
  • Title

    Economic Impact of Type I Test Errors at System and Board Levels

  • Author

    Henderson, Christopher L. ; Williams, Richard H. ; Hawkins, Charles F.

  • fYear
    1992
  • Firstpage
    444
  • Keywords
    Automatic test equipment; Automatic testing; Computer errors; Costs; Data analysis; Economic forecasting; Electronic equipment testing; Manufacturing; Predictive models; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1992. Proceedings., International
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-0760-7
  • Type

    conf

  • DOI
    10.1109/TEST.1992.527855
  • Filename
    527855
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1655774