Title :
Economic Impact of Type I Test Errors at System and Board Levels
Author :
Henderson, Christopher L. ; Williams, Richard H. ; Hawkins, Charles F.
Keywords :
Automatic test equipment; Automatic testing; Computer errors; Costs; Data analysis; Economic forecasting; Electronic equipment testing; Manufacturing; Predictive models; System testing;
Conference_Titel :
Test Conference, 1992. Proceedings., International
Print_ISBN :
0-7803-0760-7
DOI :
10.1109/TEST.1992.527855
