Title :
Functional fault coverage: the chamber of secrets or an accurate estimation of gate-level coverage?
Author :
Fummi, Franco ; Marconcini, Cristina ; Pravadelli, Graziano
Author_Institution :
Universita di Verona
Keywords :
Analytical models; Automatic test pattern generation; Digital systems; Electronic design automation and methodology; Fault detection; Pattern analysis; Performance analysis; Test pattern generators; Testing; Virtual manufacturing;
Conference_Titel :
Test Symposium, 2004. ETS 2004. Proceedings. Ninth IEEE European
Print_ISBN :
0-7695-2119-3
DOI :
10.1109/ETSYM.2004.1347649
