• DocumentCode
    1655875
  • Title

    Automatic test pattern generation for resistive bridging faults

  • Author

    Engelke, Piet ; Polian, Ilia ; Renovell, Michel ; Becker, Bernd

  • Author_Institution
    Albert-Ludwigs-University
  • fYear
    2004
  • Firstpage
    160
  • Lastpage
    165
  • Keywords
    Automatic test pattern generation; Bridge circuits; Circuit faults; Circuit simulation; Circuit testing; Electrical fault detection; Fault detection; Logic gates; Logic testing; Threshold voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium, 2004. ETS 2004. Proceedings. Ninth IEEE European
  • Print_ISBN
    0-7695-2119-3
  • Type

    conf

  • DOI
    10.1109/ETSYM.2004.1347652
  • Filename
    1347652
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1655875