DocumentCode :
1655976
Title :
Optical properties of single-crystalline Wurtzite aluminum nitride nanowires
Author :
Wu, Hue-Min ; Liang, Jaw-Yeu
Author_Institution :
Dept. of Phys., Chinese Culture Univ., Taipei, Taiwan
fYear :
2010
Firstpage :
795
Lastpage :
796
Abstract :
We have investigated the luminescence properties of single-crystalline wurtzite AlN nanowires by electron and photon excitation measurements, such as cathodoluminescence and photoluminescence. Band to band excitonic feature at 6.12 eV was first observed at room temperature in this study. Two typical defect band related transmissions around 3.0 eV and 4.85 eV were also observed, which are due to the radioactive recombination processes involving oxygen impurity and Al vacancies. The wurtzite AlN nanowires were grown on sapphire (0002) substrates by catalyst-assisted chemical vapor deposition. The morphology and structure were characterized by scanning electron microscopy, transmission electron microscopy, X-ray diffraction, and Raman analysis.
Keywords :
X-ray diffraction; aluminium compounds; cathodoluminescence; chemical vapour deposition; crystal morphology; nanowires; optical properties; photoluminescence; sapphire; scanning electron microscopy; transmission electron microscopy; vacancies (crystal); Al vacancies; Al2O3; AlN; Raman analysis; X-ray diffraction; aluminum nitride; catalyst assisted chemical vapor deposition; cathodoluminescence; crystal morphology; electron excitation measurements; luminescence properties; optical properties; oxygen impurity; photoluminescence; photon excitation measurements; radioactive recombination; sapphire substrates; scanning electron microscopy; single-crystalline wurtzite nanowires; transmission electron microscopy; Aluminum nitride; Electron optics; Impurities; Luminescence; Nanowires; Photoluminescence; Scanning electron microscopy; Spontaneous emission; Temperature; Transmission electron microscopy;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nanoelectronics Conference (INEC), 2010 3rd International
Conference_Location :
Hong Kong
Print_ISBN :
978-1-4244-3543-2
Electronic_ISBN :
978-1-4244-3544-9
Type :
conf
DOI :
10.1109/INEC.2010.5424485
Filename :
5424485
Link To Document :
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