Title :
Combined similarity discretization technology in FEM
Author :
Yanling, Shi ; Dandan, Yu ; Xingqi, Dong ; Zongsheng, Lai
Author_Institution :
Dept. of Electron. Sci. & Technol., East China Normal Univ., Shanghai, China
fDate :
6/21/1905 12:00:00 AM
Abstract :
A new similarity discretization method in FEM is presented while researching of quasistatic performance of micromachined microwave components by COMS technology. With the use of a recurrence relation, the new method not only uses much less computer memory than the conventional FEM but also simplifies the post-process.
Keywords :
finite element analysis; micromachining; microstrip lines; transmission line theory; COMS technology; FEM; micromachined microwave components; microwave transmission line; post-process simplification; quasistatic performance; recurrence relation; similarity discretization technology; stiffness matrix; Employment; Etching; Filling; Microwave technology; Microwave theory and techniques; Shape; Transmission line matrix methods;
Conference_Titel :
Computational Electromagnetics and Its Applications, 1999. Proceedings. (ICCEA '99) 1999 International Conference on
Print_ISBN :
0-7803-5802-3
DOI :
10.1109/ICCEA.1999.825081
