DocumentCode :
1656203
Title :
Revealing side-channel issues of complex circuits by enhanced leakage models
Author :
Heuser, Annelie ; Schindler, Werner ; Stöttinger, Marc
Author_Institution :
ISS - Integrated Circuit & Syst. Lab., Tech. Univ. Darmstadt, Darmstadt, Germany
fYear :
2012
Firstpage :
1179
Lastpage :
1184
Abstract :
In the light of implementation attacks a better understanding of complex circuits of security sensitive applications is an important issue. Appropriate evaluation tools and metrics are required to understand the origin of implementation flaws within the design process. The selected leakage model has significant influence on the reliability of evaluation results concerning the side-channel resistance of a cryptographic implementation. In this contribution we introduce methods, which determine the accuracy of the leakage characterization and allow to quantify the signal-to-noise ratio. This allows a quantitative assessment of the side-channel resistance of an implementation without launching an attack. We validate the conclusions drawn from our new methods by real attacks and obtain similar results. Compared to the commonly used Hamming Distance model in our experiments enhanced leakage models increased the attack efficiency by up to 500%.
Keywords :
combinational circuits; cryptography; leakage currents; logic design; complex circuits; cryptographic implementation; design process; enhanced leakage model; evaluation reliability; implementation flaws; leakage characterization; security sensitive applications; side-channel issues; side-channel resistance; signal-to-noise ratio; Approximation error; Integrated circuit modeling; Random variables; Signal to noise ratio; Stochastic processes; Vectors; approximation error; constructive side-channel analysis; secure hardware design; signal-to-noise ratio;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2012
Conference_Location :
Dresden
ISSN :
1530-1591
Print_ISBN :
978-1-4577-2145-8
Type :
conf
DOI :
10.1109/DATE.2012.6176672
Filename :
6176672
Link To Document :
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