Title :
3DHLS: Incorporating high-level synthesis in physical planning of three-dimensional (3D) ICs
Author :
Chen, Yibo ; Sun, Guangyu ; Zou, Qiaosha ; Xie, Yuan
Author_Institution :
Synopsys Inc., Mountain View, CA, USA
Abstract :
Three-dimensional (3D) circuit integration is a promising technology to alleviate performance and power related issues raised by interconnects in nanometer CMOS. Physical planning of three-dimensional integrated circuits is substantially different from that of traditional planar integrated circuits, due to the presence of multiple layers of dies. To realize the full potential offered by three-dimensional integration, it is necessary to take physical information into consideration at higher-levels of the design abstraction for 3D ICs. This paper proposes an incremental system-level synthesis framework that tightly integrates behavioral synthesis of modules into the layer assignment and floorplan- ning stage of 3D IC design. Behavioral synthesis is implemented as a sub-routine to be called to adjust delay/power/variability/area of circuit modules during the physical planning process. Experimental results show that with the proposed synthesis-during-planning methodology, the overall timing yield is improved by 8%, and the chip peak temperature reduced by 6.6°C, compared to the conventional planning-after-synthesis approach.
Keywords :
CMOS integrated circuits; high level synthesis; integrated circuit interconnections; integrated circuit layout; nanoelectronics; three-dimensional integrated circuits; 3D IC design; 3D high level synthesis; 3DHLS; area adjustment; behavioral synthesis; circuit modules; delay adjustment; design abstraction; floorplanning; incremental system-level synthesis framework; layer assignment; multiple die layers; nanometer-scale CMOS interconnects; physical planning process; power adjustment; synthesis-during-planning methodology; three-dimensional IC; three-dimensional circuit integration; three-dimensional integrated circuit planning; variability adjustment; Delay; Integrated circuits; Lead; Three dimensional displays;
Conference_Titel :
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2012
Conference_Location :
Dresden
Print_ISBN :
978-1-4577-2145-8
DOI :
10.1109/DATE.2012.6176673