1656430

Using EDIF for Transfer of Test Data: Practical Experience

Verhelst, Bas ; Morren, Richard ; Baker, Keith

1992

459

Automatic test pattern generation; Compaction; Computer aided engineering; Laboratories; Production; Software standards; Software testing; Standards development; System testing; Timing;

English

ieee

Test Conference, 1992. Proceedings., International

1089-3539

0-7803-0760-7

conf

10.1109/TEST.1992.527857

527857