• DocumentCode
    1656469
  • Title

    A quartic solution covering freeze-out and exhaustion effects in doubly doped P-type equilibrium semiconductors

  • Author

    Pieper, Ron J. ; Fenley, Justin

  • Author_Institution
    Dept. of Electr. Eng., Texas Univ., Tyler, TX
  • fYear
    2006
  • Firstpage
    142
  • Lastpage
    146
  • Abstract
    The local charge neutrality condition for same-P-type doubly-doped uniform equilibrium semiconductors is shown to lead to a quartic polynomial in a Z-parameter that is directly proportional to the concentration of holes. Analysis demonstrates that the problem is solvable exactly by identifying the only physically permissible root to a quartic polynomial. The unique solution for Z leads directly to analytic expressions for temperature dependent majority carrier concentration and the Fermi level
  • Keywords
    Fermi level; polynomials; semiconductor doping; Z-parameter; doubly doped P-type equilibrium semiconductors; exhaustion effects; freeze-out effects; quartic polynomial; Charge carrier processes; Electrons; Equations; FET integrated circuits; Ion implantation; Lead compounds; Polynomials; Semiconductor impurities; Space technology; Temperature dependence;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    System Theory, 2006. SSST '06. Proceeding of the Thirty-Eighth Southeastern Symposium on
  • Conference_Location
    Cookeville, TN
  • Print_ISBN
    0-7803-9457-7
  • Type

    conf

  • DOI
    10.1109/SSST.2006.1619087
  • Filename
    1619087