DocumentCode
1656469
Title
A quartic solution covering freeze-out and exhaustion effects in doubly doped P-type equilibrium semiconductors
Author
Pieper, Ron J. ; Fenley, Justin
Author_Institution
Dept. of Electr. Eng., Texas Univ., Tyler, TX
fYear
2006
Firstpage
142
Lastpage
146
Abstract
The local charge neutrality condition for same-P-type doubly-doped uniform equilibrium semiconductors is shown to lead to a quartic polynomial in a Z-parameter that is directly proportional to the concentration of holes. Analysis demonstrates that the problem is solvable exactly by identifying the only physically permissible root to a quartic polynomial. The unique solution for Z leads directly to analytic expressions for temperature dependent majority carrier concentration and the Fermi level
Keywords
Fermi level; polynomials; semiconductor doping; Z-parameter; doubly doped P-type equilibrium semiconductors; exhaustion effects; freeze-out effects; quartic polynomial; Charge carrier processes; Electrons; Equations; FET integrated circuits; Ion implantation; Lead compounds; Polynomials; Semiconductor impurities; Space technology; Temperature dependence;
fLanguage
English
Publisher
ieee
Conference_Titel
System Theory, 2006. SSST '06. Proceeding of the Thirty-Eighth Southeastern Symposium on
Conference_Location
Cookeville, TN
Print_ISBN
0-7803-9457-7
Type
conf
DOI
10.1109/SSST.2006.1619087
Filename
1619087
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