• DocumentCode
    1656490
  • Title

    Study of the damping processes in thickness shear mode resonator chemical sensors

  • Author

    Falconi, Christian ; Di Natale, Corrado ; D´Amico, D. ; Ferri, Giuseppe ; D´Amico, Arnaldo

  • Author_Institution
    Dipt. di Ingegneria Elettronica, Rome Univ., Italy
  • Volume
    3
  • fYear
    2001
  • fDate
    6/23/1905 12:00:00 AM
  • Firstpage
    1517
  • Abstract
    This work illustrates an alternative method of extracting signals from thickness shear mode resonator sensors. The basic idea consists of modulating the voltage supply of an oscillator circuit driven by a quartz element. The sensor signal can then be obtained measuring the time decay of the output signal in the off state, where some energy, stored in the on state, is released in the form of a damping oscillation. It has been experimentally proven that the time decay in the off state can be reproducibly related to the quartz loading by a remarkable sensitivity function. This paper shows most of the results obtained so far by this technique and discusses the general performance, advantages and disadvantages as well as comparison with the standard frequency measurement technique
  • Keywords
    chemical sensors; crystal oscillators; crystal resonators; quartz; SiO2; chemical sensors; damping oscillation; damping processes; quartz element driven oscillator circuit; quartz loading; signal extraction; thickness shear mode resonator sensors; time decay; transition phenomena; voltage supply modulation; Chemical sensors; Circuits; Coatings; Damping; Oscillators; Polymer films; Power supplies; Resonance; Resonant frequency; Slabs;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics, Circuits and Systems, 2001. ICECS 2001. The 8th IEEE International Conference on
  • Print_ISBN
    0-7803-7057-0
  • Type

    conf

  • DOI
    10.1109/ICECS.2001.957503
  • Filename
    957503