Title :
Input vector monitoring on line concurrent BIST based on multilevel decoding logic
Author :
Voyiatzis, Ioannis
Author_Institution :
Dept. of Inf., Technol. Educ. Inst. of Athens, Athens, Greece
Abstract :
Input Vector Monitoring Concurrent Built-In Self Test (BIST) schemes provide the capability to perform testing while the Circuit Under Test (CUT) operates normally, by exploiting vectors that appear at the inputs of the CUT during its normal operation. In this paper a novel input vector monitoring concurrent BIST scheme is presented, that reduces considerably the imposed hardware overhead compared to previously proposed schemes.
Keywords :
built-in self test; logic testing; BIST; circuit under test; input vector monitoring concurrent built-in self test; multilevel decoding logic; Benchmark testing; Built-in self-test; Decoding; Hardware; Logic gates; Monitoring; Vectors;
Conference_Titel :
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2012
Conference_Location :
Dresden
Print_ISBN :
978-1-4577-2145-8
DOI :
10.1109/DATE.2012.6176684
