• DocumentCode
    1656546
  • Title

    The synthesis and photoelectric response of single-crystalline V4O7 nanowires

  • Author

    Xu, Jing ; Hu, Chenguo ; Han, Huayong ; He, Mingquan ; Wan, Buyong ; Xia, Chuanhui

  • Author_Institution
    Dept. of Appl. Phys., Chongqing Univ., Chongqing, China
  • fYear
    2010
  • Firstpage
    413
  • Lastpage
    414
  • Abstract
    Vanadium oxide (V4O7) nanowires have been synthesized via a hydrothermal route. The synthesized products were characterized by X-ray diffraction (XRD), scanning electron microscopy (SEM), and transmission electron microscopy (TEM). It was found that the products are of anorthic phase and single crystalline nanowires with diameter of 150 nm and length up to 100 ¿m. The formation mechanism of the V4O7 nanowires was discussed. Light sensitivity has been investigated on the electrode made from the V4O7 nanowires at different biases. The fast current response has been observed under alternative control of light on and off within 1 s interval, indicating a potential application of the V4O7 nanowires as optical sensors/switches.
  • Keywords
    X-ray diffraction; crystal growth from solution; electrodes; nanowires; photoelectricity; scanning electron microscopy; transmission electron microscopy; vanadium compounds; SEM; TEM; V4O7; X-ray diffraction; XRD; anorthic phase; electrode; hydrothermal route; light sensitivity; optical sensor application; optical switch application; photoelectric response; scanning electron microscopy; single crystalline nanowires; single-crystalline nanowires; size 100 mum; size 150 nm; transmission electron microscopy; vanadium oxide nanowires; Crystallization; Electrodes; Lighting control; Nanowires; Optical control; Optical sensors; Scanning electron microscopy; Transmission electron microscopy; X-ray diffraction; X-ray scattering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanoelectronics Conference (INEC), 2010 3rd International
  • Conference_Location
    Hong Kong
  • Print_ISBN
    978-1-4244-3543-2
  • Electronic_ISBN
    978-1-4244-3544-9
  • Type

    conf

  • DOI
    10.1109/INEC.2010.5424511
  • Filename
    5424511