• DocumentCode
    1656588
  • Title

    Embedded micromechanical devices for the monolithic integration of MEMS with CMOS

  • Author

    Smith, J.H. ; Montague, S. ; Sniegowski, J.J. ; Murray, J.R. ; McWhorter, P.J.

  • Author_Institution
    Integrated Micromech., Microsensors, Microsensors, Sandia Nat. Labs., Albuquerque, NM, USA
  • fYear
    1995
  • Firstpage
    609
  • Lastpage
    612
  • Abstract
    A flexible, modular manufacturing process for integrating micromechanical and microelectronic devices has been developed. This process embeds the micromechanical devices in an anisotropically etched trench below the surface of the wafer. Prior to microelectronic device fabrication, this trench is refilled with oxide, chemical-mechanically polished, and sealed with a nitride cap in order to embed the micromechanical devices below the surface of the planarized wafer. The feasibility of this technique in a manufacturing environment has been demonstrated by combining a variety of embedded micromechanical structures with a 2 μm CMOS process on 6 inch wafers. A yield of 78% has been achieved on the first devices manufactured using this technique
  • Keywords
    CMOS integrated circuits; circuit optimisation; etching; integrated circuit yield; micromechanical devices; polishing; 2 micron; CMOS; MEMS; anisotropically etched trench; chemical-mechanically polished trench; embedded micromechanical devices; modular manufacturing process; monolithic integration; nitride cap; yield; Annealing; CMOS process; CMOS technology; Consumer electronics; Etching; Laboratories; Manufacturing processes; Microelectronics; Micromechanical devices; Monolithic integrated circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1995. IEDM '95., International
  • Conference_Location
    Washington, DC
  • ISSN
    0163-1918
  • Print_ISBN
    0-7803-2700-4
  • Type

    conf

  • DOI
    10.1109/IEDM.1995.499295
  • Filename
    499295