DocumentCode
1656588
Title
Embedded micromechanical devices for the monolithic integration of MEMS with CMOS
Author
Smith, J.H. ; Montague, S. ; Sniegowski, J.J. ; Murray, J.R. ; McWhorter, P.J.
Author_Institution
Integrated Micromech., Microsensors, Microsensors, Sandia Nat. Labs., Albuquerque, NM, USA
fYear
1995
Firstpage
609
Lastpage
612
Abstract
A flexible, modular manufacturing process for integrating micromechanical and microelectronic devices has been developed. This process embeds the micromechanical devices in an anisotropically etched trench below the surface of the wafer. Prior to microelectronic device fabrication, this trench is refilled with oxide, chemical-mechanically polished, and sealed with a nitride cap in order to embed the micromechanical devices below the surface of the planarized wafer. The feasibility of this technique in a manufacturing environment has been demonstrated by combining a variety of embedded micromechanical structures with a 2 μm CMOS process on 6 inch wafers. A yield of 78% has been achieved on the first devices manufactured using this technique
Keywords
CMOS integrated circuits; circuit optimisation; etching; integrated circuit yield; micromechanical devices; polishing; 2 micron; CMOS; MEMS; anisotropically etched trench; chemical-mechanically polished trench; embedded micromechanical devices; modular manufacturing process; monolithic integration; nitride cap; yield; Annealing; CMOS process; CMOS technology; Consumer electronics; Etching; Laboratories; Manufacturing processes; Microelectronics; Micromechanical devices; Monolithic integrated circuits;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1995. IEDM '95., International
Conference_Location
Washington, DC
ISSN
0163-1918
Print_ISBN
0-7803-2700-4
Type
conf
DOI
10.1109/IEDM.1995.499295
Filename
499295
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