DocumentCode :
1656588
Title :
Embedded micromechanical devices for the monolithic integration of MEMS with CMOS
Author :
Smith, J.H. ; Montague, S. ; Sniegowski, J.J. ; Murray, J.R. ; McWhorter, P.J.
Author_Institution :
Integrated Micromech., Microsensors, Microsensors, Sandia Nat. Labs., Albuquerque, NM, USA
fYear :
1995
Firstpage :
609
Lastpage :
612
Abstract :
A flexible, modular manufacturing process for integrating micromechanical and microelectronic devices has been developed. This process embeds the micromechanical devices in an anisotropically etched trench below the surface of the wafer. Prior to microelectronic device fabrication, this trench is refilled with oxide, chemical-mechanically polished, and sealed with a nitride cap in order to embed the micromechanical devices below the surface of the planarized wafer. The feasibility of this technique in a manufacturing environment has been demonstrated by combining a variety of embedded micromechanical structures with a 2 μm CMOS process on 6 inch wafers. A yield of 78% has been achieved on the first devices manufactured using this technique
Keywords :
CMOS integrated circuits; circuit optimisation; etching; integrated circuit yield; micromechanical devices; polishing; 2 micron; CMOS; MEMS; anisotropically etched trench; chemical-mechanically polished trench; embedded micromechanical devices; modular manufacturing process; monolithic integration; nitride cap; yield; Annealing; CMOS process; CMOS technology; Consumer electronics; Etching; Laboratories; Manufacturing processes; Microelectronics; Micromechanical devices; Monolithic integrated circuits;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 1995. IEDM '95., International
Conference_Location :
Washington, DC
ISSN :
0163-1918
Print_ISBN :
0-7803-2700-4
Type :
conf
DOI :
10.1109/IEDM.1995.499295
Filename :
499295
Link To Document :
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