• DocumentCode
    1656665
  • Title

    Analysis of Steady State Detection of Resistive Bridging Faults in BiCMOS Digital ICs

  • Author

    Favalli, Michele ; Dalpasso, Marcello ; Olivo, Piero ; Riccò, Bruno

  • fYear
    1995
  • Firstpage
    466
  • Keywords
    BiCMOS integrated circuits; CMOS logic circuits; CMOS technology; Circuit faults; Circuit simulation; Circuit testing; Electrical fault detection; Fault detection; Semiconductor device modeling; Steady-state;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1992. Proceedings., International
  • Conference_Location
    Baltimore, MD
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-0760-7
  • Type

    conf

  • DOI
    10.1109/TEST.1992.527858
  • Filename
    527858
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1656665