DocumentCode :
165668
Title :
Metal and organic nanostructure fabrication by electron beam lithography and dry liftoff
Author :
Abbas, Abdullah Saud ; Alqarni, Sondos ; Shokouhi, Babak B. ; Abbas, Abdullah Saud ; Yavuz, Mustafa ; Bo Cui
Author_Institution :
Waterloo Inst. for Nanotechnol. (WIN), Univ. of Waterloo, Waterloo, ON, Canada
fYear :
2014
fDate :
18-21 Aug. 2014
Firstpage :
392
Lastpage :
395
Abstract :
Liftoff and direct etch are the two most popular pattern transfer methods used for nanofabrication. The latter is limited by the etching rate selectivity between the resist and the substrate material, which is usually on the order of unity for dry plasma etching. Moreover, some metals including most noble metals cannot be dry etched. Thus liftoff is often the preferred pattern transfer method. Liftoff is typically carried out using a solvent that dissolves the resist. A strong solvent aided by ultrasonic agitation and/or heating is sometimes needed if the resist is difficult to dissolve due to, for example, cross-linking by exposure to electron beam or plasma. Another serious issue with conventional liftoff process is that the metal debris may stay at the active device area after drying. To avoid the above issues, dry liftoff using mechanical approach may be utilized. Here we report a simple dry liftoff technique using a scotch tape to peel off the resist film coated with the material to lift off. We obtained high resolution (down to 50 nm) liftoff of metal and organic materials polystyrene and Alq3, with PMMA as electron beam resist coated on a substrate treated with a low energy surfactant.
Keywords :
dissolving; electron resists; metals; nanofabrication; nanolithography; polymer films; sputter etching; surfactants; PMMA; conventional liftoff process; direct etching; dissolving; dry plasma etching; electron beam exposure; electron beam lithography; electron beam resist; etching rate selectivity; heating; low energy surfactant; metal debris; metal nanostructure fabrication; nanofabrication; organic nanostructure fabrication; pattern transfer methods; peeling; plasma exposure; polystyrene; resist film coating; scotch tape; simple dry liftoff technique; substrate material; ultrasonic agitation; Electron beams; Films; Lithography; Metals; Resists; Solvents; Substrates;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nanotechnology (IEEE-NANO), 2014 IEEE 14th International Conference on
Conference_Location :
Toronto, ON
Type :
conf
DOI :
10.1109/NANO.2014.6968083
Filename :
6968083
Link To Document :
بازگشت