Title :
Spintronic memristor based temperature sensor design with CMOS current reference
Author :
Bi, Xiuyuan ; Zhang, Chao ; Li, Hai ; Chen, Yiran ; Pino, Robinson E.
Author_Institution :
Polytech. Inst. of NYU, Brooklyn, OH, USA
Abstract :
As the technology scales down, the increased power density brings in significant system reliability issues. Therefore, the temperature monitoring and the induced power management become more and more critical. The thermal fluctuation effects of the recently discovered spintronic memristor make it a promising candidate as a temperature sensing device. In this paper, we carefully analyzed the thermal fluctuations of spintronic memristor and the corresponding design considerations. On top of it, we proposed a temperature sensing circuit design by combining spintronic memristor with the traditional CMOS current reference. Our simulation results show that the proposed design can provide high accuracy of temperature detection within a much smaller footprint compared to the traditional CMOS temperature sensor designs. As magnetic device scales down, the relatively high power consumption is expected to be reduced.
Keywords :
CMOS integrated circuits; magnetic sensors; magnetoelectronics; memristors; temperature sensors; CMOS current reference; CMOS temperature sensing circuit design; induced power management; magnetic device; power consumption; power density; spintronic memristor based temperature sensor design; temperature detection; temperature monitoring; thermal fluctuation; Current density; Fluctuations; Magnetoelectronics; Memristors; Resistance; Temperature sensors; current reference; memristor; temperature; thermal sensor;
Conference_Titel :
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2012
Conference_Location :
Dresden
Print_ISBN :
978-1-4577-2145-8
DOI :
10.1109/DATE.2012.6176693