A test bed for wireless optical LANs

Author

Aguiar, Rui L. ; Tavares, Antdnio ; Alves, Luis Nero ; Valadas, Rui ; Santos, Daniel M.

Author_Institution

Dept. de Electron. e Telecommun., Aveiro Univ., Portugal

Volume

3

fYear

2001

fDate

6/23/1905 12:00:00 AM

Firstpage

1569

Abstract

This paper presents a test bed for wireless optical LANs. This test bed is flexible, supporting multiple implementation choices. The test bed currently covers all physical layer issues, from FEC coders and LED drivers to front-ends, clock recovery circuits, Viterbi decoders, and sectored receivers. These are implemented with multiple technologies, with DSPs and FPGAs for digital functions, and ASICs and discrete electronics for the analogue electronics. Furthermore, the test bed provides a semi-controlled real life test environment, allowing for close comparison between theoretical and practical results

Keywords

Viterbi decoding; analogue processing circuits; application specific integrated circuits; digital signal processing chips; driver circuits; encoding; field programmable gate arrays; forward error correction; light emitting diodes; optical fibre LAN; optical receivers; optical transmitters; synchronisation; telecommunication equipment testing; test equipment; ASICs; DSPs; FEC coders; FPGAs; LED drivers; Viterbi decoders; analogue electronics; clock recovery circuits; digital functions; discrete electronics; flexible test bed; front-ends; physical layer issues; sectored receivers; semi-controlled real life test environment; test bed; wireless optical LANs; Circuit testing; Clocks; Decoding; Driver circuits; Life testing; Light emitting diodes; Optical receivers; Physical layer; Viterbi algorithm; Wireless LAN;

fLanguage

English

Publisher

ieee

Conference_Titel

Electronics, Circuits and Systems, 2001. ICECS 2001. The 8th IEEE International Conference on

Print_ISBN

0-7803-7057-0

Type

conf

DOI

10.1109/ICECS.2001.957516

Filename

957516