Title :
A test bed for wireless optical LANs
Author :
Aguiar, Rui L. ; Tavares, Antdnio ; Alves, Luis Nero ; Valadas, Rui ; Santos, Daniel M.
Author_Institution :
Dept. de Electron. e Telecommun., Aveiro Univ., Portugal
fDate :
6/23/1905 12:00:00 AM
Abstract :
This paper presents a test bed for wireless optical LANs. This test bed is flexible, supporting multiple implementation choices. The test bed currently covers all physical layer issues, from FEC coders and LED drivers to front-ends, clock recovery circuits, Viterbi decoders, and sectored receivers. These are implemented with multiple technologies, with DSPs and FPGAs for digital functions, and ASICs and discrete electronics for the analogue electronics. Furthermore, the test bed provides a semi-controlled real life test environment, allowing for close comparison between theoretical and practical results
Keywords :
Viterbi decoding; analogue processing circuits; application specific integrated circuits; digital signal processing chips; driver circuits; encoding; field programmable gate arrays; forward error correction; light emitting diodes; optical fibre LAN; optical receivers; optical transmitters; synchronisation; telecommunication equipment testing; test equipment; ASICs; DSPs; FEC coders; FPGAs; LED drivers; Viterbi decoders; analogue electronics; clock recovery circuits; digital functions; discrete electronics; flexible test bed; front-ends; physical layer issues; sectored receivers; semi-controlled real life test environment; test bed; wireless optical LANs; Circuit testing; Clocks; Decoding; Driver circuits; Life testing; Light emitting diodes; Optical receivers; Physical layer; Viterbi algorithm; Wireless LAN;
Conference_Titel :
Electronics, Circuits and Systems, 2001. ICECS 2001. The 8th IEEE International Conference on
Print_ISBN :
0-7803-7057-0
DOI :
10.1109/ICECS.2001.957516
