• DocumentCode
    1656876
  • Title

    Transistor Fault Coverage for Self-Testing CMOS Checkers

  • Author

    Liden, Peter ; Dahlgren, Peter ; Torin, Jan

  • fYear
    1992
  • Firstpage
    476
  • Keywords
    Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Computational modeling; Computer simulation; Electrical fault detection; Fault detection; Semiconductor device modeling; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1992. Proceedings., International
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-0760-7
  • Type

    conf

  • DOI
    10.1109/TEST.1992.527859
  • Filename
    527859
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1656876