Title :
A sensor-assisted self-authentication framework for hardware trojan detection
Author :
Li, Min ; Davoodi, Azadeh ; Tehranipoor, Mohammad
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Wisconsin at Madison, Madison, WI, USA
Abstract :
This work offers a framework which does not rely on a Golden IC (GIC) during hardware Trojan (HT) detection. GIC is a Trojan-free IC which is required, in all existing HT frameworks, as a reference point to verify the responses obtained from an IC under authentication. However, identifying a GIC is not a trivial task. A GIC may not even exist, since all the fabricated ICs may be HT-infected. We propose a framework which is based on adding a set of detection sensors to a design which are integrated in the free spaces on the layout and fabricated on the same die. After fabrication, a self-authentication procedure is proposed in order to determine if a Trojan is inserted in a set of arbitrarily-selected paths in the design. The detection process uses on-chip measurements on the sensors and the design paths in order to evaluate the correlation between a set of actual and predicted delay ranges. Error in the on-chip measurement infrastructure is considered. If our framework determines that a Trojan is (or is not) inserted on a considered path, then it is accurate. In our computational experiments, conducted for challenging cases of small Trojan circuits in the presence of die-to-die and within-die process variations, we report a high detection rate to show its effectiveness in realizing a self-authentication process which is independent of a GIC.
Keywords :
integrated circuit layout; integrated circuit measurement; integrated circuit packaging; Trojan circuits; design path; detection sensors; die-to-die variation; hardware Trojan detection; on-chip measurement infrastructure; sensor-assisted self-authentication framework; within-die process variation; Delay; Layout; Semiconductor device measurement; Sensors; System-on-a-chip; Trojan horses;
Conference_Titel :
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2012
Conference_Location :
Dresden
Print_ISBN :
978-1-4577-2145-8
DOI :
10.1109/DATE.2012.6176698