• DocumentCode
    1656956
  • Title

    Towards improving simulation of analog circuits using model order reduction

  • Author

    Aridhi, Henda ; Zaki, Mohamed H. ; Tahar, Sofiène

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Concordia Univ., Montréal, QC, Canada
  • fYear
    2012
  • Firstpage
    1337
  • Lastpage
    1342
  • Abstract
    Large analog circuit models are very expensive to evaluate and verify. New techniques are needed to shorten time-to-market and to reduce the cost of producing a correct analog integrated circuit. Model order reduction is an approach used to reduce the computational complexity of the mathematical model of a dynamical system, while capturing its main features. This technique can be used to reduce an analog circuit model while retaining its realistic behavior. In this paper, we present an approach to model order reduction of nonlinear analog circuits. We model the circuit using fuzzy differential equations and use qualitative simulation and K-means clustering to discretion efficiently its state space. Moreover, we use a conformance checking approach to refine model order reduction steps and guarantee simulation acceleration and accuracy. In order to illustrate the effectiveness of our method, we applied it to a transmission line with nonlinear diodes and a large nonlinear ring oscillator circuit. Experimental results show that our reduced models are more than one order of magnitude faster and accurate when compared to existing methods.
  • Keywords
    analogue integrated circuits; computational complexity; differential equations; fuzzy set theory; integrated circuit modelling; pattern clustering; semiconductor diodes; K-means clustering; analog integrated circuit model; computational complexity; cost reduction; fuzzy differential equations; mathematical model; model order reduction; model order reduction steps; nonlinear analog circuits; nonlinear diodes; nonlinear ring oscillator circuit; qualitative simulation; time-to-market; transmission line; Analog circuits; Computational modeling; Equations; Integrated circuit modeling; Mathematical model; Transient analysis; Vectors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation & Test in Europe Conference & Exhibition (DATE), 2012
  • Conference_Location
    Dresden
  • ISSN
    1530-1591
  • Print_ISBN
    978-1-4577-2145-8
  • Type

    conf

  • DOI
    10.1109/DATE.2012.6176699
  • Filename
    6176699