Title :
Micromagnetic calculations of the remanence properties of dual-layer thin films
Author_Institution :
National Institute of Standards and Technology, Colorado
Keywords :
Micromagnetics; Remanence; Transistors;
Conference_Titel :
Electromagnetic Field Computation, 1992. Digest of the Fifth Biennial IEEE Conference on
Conference_Location :
Claremont, CA, USA
DOI :
10.1109/CEFC.1992.720680
