• DocumentCode
    1657209
  • Title

    Micromagnetic calculations of the remanence properties of dual-layer thin films

  • Author

    Oti, J.O.

  • Author_Institution
    National Institute of Standards and Technology, Colorado
  • fYear
    1992
  • Keywords
    Micromagnetics; Remanence; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Field Computation, 1992. Digest of the Fifth Biennial IEEE Conference on
  • Conference_Location
    Claremont, CA, USA
  • Type

    conf

  • DOI
    10.1109/CEFC.1992.720680
  • Filename
    720680
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1657209