Title :
A review of the single event effects performance of x86 microprocessors
Author :
Hiemstra, David M. ; Bailak, George
Abstract :
The paper presents a review of the experimental single event upset performance of the Pentium®4, Pentium® III, Pentium® II, Celeron®, and Pentium® MMX microprocessors using proton irradiation. Results are compared with previously tested x86 microprocessors. Single event latchup and total dose effects are also discussed.
Keywords :
computer equipment testing; microprocessor chips; radiation effects; Celeron; Pentium 4; Pentium II; Pentium III; Pentium MMX; proton irradiation; single event latchup; single event upset performance; total dose effects; x86 microprocessors; CMOS process; Circuit testing; Logic testing; Low earth orbit satellites; Manufacturing processes; Microprocessors; Performance evaluation; Protection; Protons; Single event upset;
Conference_Titel :
Electrical and Computer Engineering, 2004. Canadian Conference on
Print_ISBN :
0-7803-8253-6
DOI :
10.1109/CCECE.2004.1347716
