Title :
ScanBist A Multi-frequency Scan-Based BIST Method
Author :
Nadeau-Dostie, Benoit ; Burek, Dwayne ; Hassan, Abu S M
Keywords :
Automatic test pattern generation; Built-in self-test; Circuit faults; Circuit testing; Clocks; Frequency conversion; Frequency synchronization; Logic testing; Protocols; System testing;
Conference_Titel :
Test Conference, 1992. Proceedings., International
Print_ISBN :
0-7803-0760-7
DOI :
10.1109/TEST.1992.527862
