• DocumentCode
    1657661
  • Title

    Almost every wire is removable: A modeling and solution for removing any circuit wire

  • Author

    Yang, Xiaoqing ; Lam, Tak-Kei ; Tang, Wai-Chung ; Wu, Yu-Liang

  • Author_Institution
    Dept. of Comput. Sci. & Eng., Chinese Univ. of Hong Kong, Shatin, China
  • fYear
    2012
  • Firstpage
    1573
  • Lastpage
    1578
  • Abstract
    Rewiring is a flexible and useful logic transformation technique through which a target wire can be removed by adding its alternative logics without changing the circuit functionality. In today´s deep sub-micron era, circuit wires have become a dominating factor in most EDA processes and there are situations where removing a certain set of (perhaps extremely unwanted) wires is very useful. However, it has been experimentally suggested that the rewiring rate (percentage of original circuit wires being removable by rewiring) is only 30 to 40% for optimized circuits in the past. In this paper, we propose a generalized error cancellation modeling and flow to show that theoretically almost every circuit wire is removable under this flow. In the Flow graph Error Cancellation based Rewiring (FECR) scheme we propose here, a rewiring rate of 95% of even optimized circuits is obtainable under this scheme, affirming the basic claim of this paper. To our knowledge, this is the first known rewiring scheme being able to achieve this near complete rewiring rate. Consequently, this wire-removal process can now be considered as a powerful atomic and universal operation for logic transformations, as virtually every circuit node can also be removed through repetitions of this rewiring process. Besides, this modeling can also serve as a general framework containing many other rewiring techniques as its special cases.
  • Keywords
    electronic design automation; graph theory; integrated circuit design; integrated circuit modelling; logic design; EDA processes; circuit wire; flow graph error cancellation based rewiring; generalized error cancellation modeling; logic transformation technique; rewiring technique; Circuit faults; Flow graphs; Integrated circuit modeling; Logic gates; Testing; Vectors; Wires;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation & Test in Europe Conference & Exhibition (DATE), 2012
  • Conference_Location
    Dresden
  • ISSN
    1530-1591
  • Print_ISBN
    978-1-4577-2145-8
  • Type

    conf

  • DOI
    10.1109/DATE.2012.6176723
  • Filename
    6176723