Title :
InGaP/GaAs power HBTs with a low bias voltage
Author :
Ohara, S. ; Yamada, H. ; Iwai, T. ; Yamaguchi, Y. ; Imanishi, K. ; Joshin, K.
Author_Institution :
Fujitsu Labs. Ltd., Atsugi, Japan
Abstract :
This paper describes InGaP/GaAs heterojunction bipolar transistors (HBTs) for L-band power amplifiers with low bias voltage. A fabricated HBT with an emitter size of 2 μm×20 μm×64 fingers offers an output power, Pout, of 34.3 dBm and a power added efficiency, ηadd, of 57.7 % at 1.5 GHz with a collector bias of 3.5 V under class AB operation. The power HBT indicates an output power of over 31 dBm at a bias of as low as 2.5 V. Adjacent channel power leakage of the power HBT according to the Japanese standards of personal digital cellular phone (PDC) is -49 dBc when Pout is 31.4 dBm and ηadd is 50.3% with collector bias of 3.5 V. This performance shows that InGaP/GaAs HBT is a useful device with a low bias voltage
Keywords :
III-V semiconductors; UHF bipolar transistors; UHF power amplifiers; cellular radio; digital radio; gallium arsenide; heterojunction bipolar transistors; indium compounds; personal communication networks; power bipolar transistors; 1.5 GHz; 3.5 V; 57.7 percent; InGaP-GaAs; L-band power amplifiers; adjacent channel power leakage; bias voltage; class AB operation; collector bias; emitter size; heterojunction bipolar transistors; output power; personal digital cellular phone; power HBTs; power added efficiency; Charge carrier density; Fingers; Gallium arsenide; Gold; Heterojunction bipolar transistors; L-band; Laboratories; Low voltage; Power amplifiers; Power generation;
Conference_Titel :
Electron Devices Meeting, 1995. IEDM '95., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-2700-4
DOI :
10.1109/IEDM.1995.499336