DocumentCode
1657879
Title
A fast testing method for sequential circuits at the state transition level
Author
Wang, Wei-Lun ; Wang, Jhing-Fa ; Lee, Kuen-Jong
fYear
1995
Firstpage
514
Keywords
Circuit faults; Circuit testing; Controllability; Hardware; Logic gates; Logic testing; Observability; Pins; Sequential analysis; Sequential circuits;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1992. Proceedings., International
Conference_Location
Baltimore, MD
ISSN
1089-3539
Print_ISBN
0-7803-0760-7
Type
conf
DOI
10.1109/TEST.1992.527863
Filename
527863
Link To Document