Title :
Automating functional coverage analysis based on an executable specification
Author :
Regimbal, Sébastien ; Lemire, Jean-François ; Savaria, Yvon ; Bois, Guy ; Aboulhamid, El Mostapha ; Baron, André
Author_Institution :
Ecole Polytechnique de Montreal, Que., Canada
Abstract :
This paper presents a novel approach for functional coverage analysis automation. It is well known that functional verification is a real bottleneck in any digital design development. Consequently, it is necessary to develop new methodologies to increase the quality of functional verification. A metric that measures the functional coverage is specific to each design, and it depends on its functional requirements. Hence, we propose a methodology supported by a tool that automates the coverage analysis at the functional level. Our tool takes as entry a standard executable specification and generates test bench components aimed at performing a functional coverage analysis on a specific design. We use functional metrics as parameters in our tool and apply theses metrics on an executable specification. Using our methodology, we are able to provide a quantitative evaluation of test suites developed to exercise the functionality defined in an executable specification. The application of these test suites on a RTL design improves error detection, through a better exploration of the design. It also increases the degree of confidence in the design.
Keywords :
formal specification; formal verification; hardware description languages; integrated circuit design; RTL design; error detection; executable specification; functional coverage analysis automation; functional level; functional metrics; functional verification; register transfer level; test bench component; Acceleration; Automation; Conferences; Explosions; Hardware; Pattern analysis; Performance analysis; Performance evaluation; System testing; System-on-a-chip;
Conference_Titel :
System-on-Chip for Real-Time Applications, 2003. Proceedings. The 3rd IEEE International Workshop on
Print_ISBN :
0-7695-1944-X
DOI :
10.1109/IWSOC.2003.1213040