DocumentCode :
165806
Title :
Deca-nanoscale maximum gate length of plasma wave transistor for operating terahertz emitter based on strained silicon platform
Author :
Jong Yul Park ; Sung-Ho Kim ; Kyung Rok Kim
Author_Institution :
Sch. of Electr. & Comput. Eng., Ulsan Nat. Inst. of Sci. & Technol., Ulsan, South Korea
fYear :
2014
fDate :
18-21 Aug. 2014
Firstpage :
150
Lastpage :
153
Abstract :
In this work, we have shown that plasma-wave transistor (PWT) operates as a terahertz (THz) emitter below maximum gate length (Lmax). Because the channel mobility (μ) of strained silicon (sSi) is higher than silicon (Si), we investigate how emission frequency range and Lmax of sSi PWT THz emitter are improved compared to Si PWT THz emitter by analyzing the effect of momentum relaxation time (τp) and electron effective mass (m) on a design window of PWT THz emitter.
Keywords :
nanoelectronics; plasma devices; plasma waves; submillimetre wave transistors; terahertz wave devices; PWT THz emitter; Si; deca-nanoscale maximum gate length; design window; electron effective mass; emission frequency range; momentum relaxation time effect; plasma wave transistor; strained silicon platform; terahertz emitter; Field effect transistors; Logic gates; Plasma waves; Security; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nanotechnology (IEEE-NANO), 2014 IEEE 14th International Conference on
Conference_Location :
Toronto, ON
Type :
conf
DOI :
10.1109/NANO.2014.6968155
Filename :
6968155
Link To Document :
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