DocumentCode
1658100
Title
General classes of Bayesian lower bounds for outage error probability and MSE
Author
Routtenberg, Tirza ; Tabrikian, Joseph
Author_Institution
Dept. of Electr. & Comput. Eng., Ben-Gurion Univ. of the Negev, Beer-Sheva, Israel
fYear
2009
Firstpage
69
Lastpage
72
Abstract
In this paper, new classes of lower bounds on the outage error probability and on the minimum mean-square-error (MSE) in Bayesian parameter estimation are proposed. The outage error probability and the MSE are important criteria in parameter estimation. However, computation of these terms is usually not tractable. The proposed outage error probability class of lower bounds is derived using reverse Houmllder inequality. This class is utilized to derive a new class of Bayesian MSE bounds. It is shown that the tightest bound from the proposed class is achieved by the generalized maximum a-posteriori probability (MAP) estimation. In addition, for unimodal symmetric conditional probability density functions, the tightest MSE bound in this class coincides with the minimum MSE (MMSE) obtained by the conditional expectation estimator. It is proved that the tightest MSE bound in this class is always tighter than the Ziv-Zakai lower bounds.
Keywords
Bayes methods; error statistics; least mean squares methods; maximum likelihood estimation; parameter estimation; Bayesian lower bounds; Bayesian parameter estimation; Ziv-Zakai lower bounds; maximum a-posteriori probability estimation; minimum mean-square-error; outage error probability; reverse Houmllder inequality; Bayesian methods; Error probability; Estimation error; Maximum a posteriori estimation; Parameter estimation; Performance analysis; Probability density function; Random variables; Signal to noise ratio; System analysis and design; Bayesian parameter estimation; maximum a-posteriori probability (MAP); mean-square-error (MSE); performance lower bounds; probability of outage error;
fLanguage
English
Publisher
ieee
Conference_Titel
Statistical Signal Processing, 2009. SSP '09. IEEE/SP 15th Workshop on
Conference_Location
Cardiff
Print_ISBN
978-1-4244-2709-3
Electronic_ISBN
978-1-4244-2711-6
Type
conf
DOI
10.1109/SSP.2009.5278638
Filename
5278638
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