DocumentCode :
165817
Title :
Nanoscale vacuum channel transistor
Author :
Jin-Woo Han ; Meyyappan, M.
Author_Institution :
Center for Nanotechnol., NASA Ames Res. Center, Moffett Field, CA, USA
fYear :
2014
fDate :
18-21 Aug. 2014
Firstpage :
172
Lastpage :
175
Abstract :
Despite of high gain, fast speed, and superior distortion immunity, vacuum electronic devices have been replaced by solid-state devices such as transistors due to their poor reliability and high power consumption. Such constraints mostly appear as it is bulky and discrete. The weaknesses of the traditional vacuum tubes are solved if the vacuum tubes are made by silicon nanofabrication technologies and the operation mechanism is shifted from thermionic emission into field emission. In this work, sub 100-nm vacuum tubes are fabricated by using conventional silicon process. The gap formation methods beyond sub-lithographic limit are suggested and its current-voltage characteristics are presented.
Keywords :
MOSFET; field emission; nanoelectronics; nanofabrication; semiconductor device reliability; thermionic emission; transistors; vacuum microelectronics; vacuum tubes; MOSFET; current-voltage characteristics; field emission; gap formation methods; high power consumption; nanoscale vacuum channel transistor; reliability; silicon nanofabrication technology; solid-state devices; sub-lithographic limit; thermionic emission; vacuum electronic devices; vacuum tubes; Cathodes; Electric fields; Electron tubes; Nanoscale devices; Reliability; Silicon; Transistors; field emission; nanoscale; silicon process; vacuum channel transistor; vacuum tube;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nanotechnology (IEEE-NANO), 2014 IEEE 14th International Conference on
Conference_Location :
Toronto, ON
Type :
conf
DOI :
10.1109/NANO.2014.6968160
Filename :
6968160
Link To Document :
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