• DocumentCode
    1658260
  • Title

    Analysis of coupling of composite dielectric resonator structure using mode matching technique

  • Author

    Bhattacharjee, T. ; Tu, Xuan

  • Author_Institution
    Dept. of Electr. Eng., New Jersey Inst. of Technol., Newark, NJ, USA
  • fYear
    1989
  • Firstpage
    659
  • Abstract
    A completely shielded dielectric resonator (DR) structure consisting of a DR placed on a dielectric substrate is considered. This configuration is compared with one that has a very-low-dielectric-constant spacer. Particularly, the coupling coefficient between the DR and the microstrip line is analyzed and evaluated by using the mode-matching technique, which is based on dividing the resonator structure into partial regions and regarding them as sections of dielectrically loaded waveguides. The propagation constants are found by solving the resulting transcendental equation by enforcing the continuity of the tangential field components inside each partial region and the condition of vanishing tangential electric field on the metallic enclosure. The numerical evaluation of the coupling is obtained for different DR materials and different substrate thicknesses. The electric field distributions inside the structure with and without the space are also evaluated and compared.<>
  • Keywords
    dielectric resonators; electric fields; composite dielectric resonator structure; coupling coefficient; dielectrically loaded waveguides; electric field distributions; microstrip line; mode-matching; propagation constants; tangential field components; transcendental equation; very-low-dielectric-constant spacer; Application specific integrated circuits; Coupling circuits; Dielectric constant; Dielectric materials; Dielectric substrates; Equations; Loaded waveguides; Microstrip components; Propagation constant; Waveguide components;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation Society International Symposium, 1989. AP-S. Digest
  • Conference_Location
    San Jose, CA, USA
  • Type

    conf

  • DOI
    10.1109/APS.1989.134774
  • Filename
    134774