Title :
Characterization, cathodoluminescence and field-emission properties of morphology-tunable CdS micro/nanostructures
Author :
Zhai, Tianyou ; Fang, Xiaosheng ; Xu, Xijin ; Bando, Yoshio ; Golberg, Dmitri
Author_Institution :
World Premier Int. Center for Mater. Nanoarchitectonics (MANA), Nat. Inst. for Mater. Sci. (NIMS), Ibaraki, Japan
Abstract :
High-quality, uniform CdS one-dimensional (1D) micro/nanostructures with different morphologies, e.g. microrods, sub-microwires and nanotips, are fabricated through a facile and effective thermal evaporation process. Their structural, cathodoluminescence and field-emission (FE) properties are systematically investigated. Microrods and nanotips exhibit sharp near band edge (NBE) emission and broad deep level (DL) emission, whereas sub-microwires show only the DL emission. A significant decrease in a DL/NBE intensity ratio is observed along a tapered nanotip towards a smaller diameter part. This behavior is understood under consideration of defect concentrations in the nanotips, as analyzed with high-resolution transmission electron microscopy (HRTEM). Field-emission (FE) measurements show that the nanotips possess best FE characteristics with a relatively low turn-on field of 5.28 V/¿m and the highest field-enhancement factor of 4819 among all 1D CdS nanostructures reported to date. The field-enhancement factor, turn-on and threshold fields are discussed related to structure morphology and vacuum gap variations under emission.
Keywords :
II-VI semiconductors; cadmium compounds; cathodoluminescence; deep levels; evaporation; field emission; nanofabrication; nanostructured materials; transmission electron microscopy; CdS; HRTEM; broad deep level emission; cathodoluminescence; defect concentrations; field-emission property; field-enhancement factor; high-resolution transmission electron microscopy; microrods; morphology-tunable microstructure; nanotips; one-dimensional microstructure; one-dimensional nanostructure; sharp near band edge emission; structure morphology; submicrowires; thermal evaporation process; vacuum gap variations; Electron optics; Iron; Morphology; Nanostructured materials; Nanostructures; Nonlinear optical devices; Optical microscopy; Scanning electron microscopy; Stimulated emission; Transmission electron microscopy;
Conference_Titel :
Nanoelectronics Conference (INEC), 2010 3rd International
Conference_Location :
Hong Kong
Print_ISBN :
978-1-4244-3543-2
Electronic_ISBN :
978-1-4244-3544-9
DOI :
10.1109/INEC.2010.5424574