Atomistic modeling of scratching process based on Atomic Force Microscope: Effects of temperature

Author

Muhammad Khan, Hanif ; Kim, Sung-Gaun

Author_Institution

Div. of Mech. & Automotive Eng., Kongju Nat. Univ., Cheonan, South Korea

fYear

2010

Firstpage

134

Lastpage

135

Abstract

A three-dimensional molecular dynamics model has been used to investigate the effects of temperature during atomic force microscopy (AFM) based scratching process. Effects of temperature have been taken into consideration as tribological properties are affected significantly by temperature. Deformation behavior, force components, tribological behavior and dislocations generation have been taken into consideration. It has been found that, low temperature like 200 K is better choice considering these aspects of nanometric scratching process.

Keywords

atomic force microscopy; deformation; dislocations; molecular dynamics method; nanostructured materials; tribology; AFM; atomic force microscopy; atomistic modeling; deformation; dislocations; force components; nanometric scratching process; temperature effects; three-dimensional molecular dynamics model; tribological property; Atomic force microscopy; Atomic measurements; Fabrication; Friction; Nickel; Plastics; Scanning probe microscopy; Temperature; Thermostats; Vehicle dynamics;

fLanguage

English

Publisher

ieee

Conference_Titel

Nanoelectronics Conference (INEC), 2010 3rd International

Conference_Location

Hong Kong

Print_ISBN

978-1-4244-3543-2

Electronic_ISBN

978-1-4244-3544-9

Type

conf

DOI

10.1109/INEC.2010.5424579

Filename

5424579