• DocumentCode
    1658819
  • Title

    A new approach for quality control of sound speakers combining type-2 fuzzy logic and fractal theory

  • Author

    Melin, Patricia ; Castillo, Oscar

  • Author_Institution
    Dept. of Comput. Sci., Tijuana Inst. of Technol., Chula Vista, CA, USA
  • Volume
    2
  • fYear
    2002
  • fDate
    6/24/1905 12:00:00 AM
  • Firstpage
    825
  • Lastpage
    830
  • Abstract
    We describe the application of type-2 fuzzy logic to the problem of automated quality control in sound speaker manufacturing. Traditional quality control has been done by manually checking the quality of sound after production. This manual checking of the speakers is time-consuming and has occasionally been the cause of errors in quality evaluation. For this reason, we developed an intelligent system for automated quality control in sound speaker manufacturing. The intelligent system has a type-2 fuzzy rule base containing the knowledge of human experts in quality control. The parameters of the fuzzy system are tuned by applying neural networks using, as training data, a real time series of measured sounds as given by good sound speakers. We also use the fractal dimension as a measure of the complexity of the sound signal
  • Keywords
    audio signal processing; fractals; fuzzy logic; industrial control; intelligent control; loudspeakers; neural nets; quality control; time series; tuning; automated quality control; fractal dimension; fractal theory; fuzzy rule base; human expert knowledge; intelligent system; loudspeaker manufacturing; manual checking; neural networks; parameter tuning; sound quality; sound signal complexity; sound speaker quality control; time series; training data; type-2 fuzzy logic; Fuzzy control; Fuzzy logic; Fuzzy systems; Humans; Intelligent manufacturing systems; Loudspeakers; Manufacturing automation; Neural networks; Production; Quality control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Fuzzy Systems, 2002. FUZZ-IEEE'02. Proceedings of the 2002 IEEE International Conference on
  • Conference_Location
    Honolulu, HI
  • Print_ISBN
    0-7803-7280-8
  • Type

    conf

  • DOI
    10.1109/FUZZ.2002.1006611
  • Filename
    1006611