SYSTEM PERSPECTWE ON DIAGNOSTIC TESTING

Author

Simpson, W.R. ; Sheppard, J.W.

fYear

1992

Firstpage

547

Keywords

Defense industry; Delay; Job shop scheduling; Manufacturing processes; Performance evaluation; Radar; System testing; Very large scale integration;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 1992. Proceedings., International

ISSN

1089-3539

Print_ISBN

0-7803-0760-7

Type

DOI

10.1109/TEST.1992.527868

Filename

527868

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