Title :
SYSTEM PERSPECTWE ON DIAGNOSTIC TESTING
Author :
Simpson, W.R. ; Sheppard, J.W.
Keywords :
Defense industry; Delay; Job shop scheduling; Manufacturing processes; Performance evaluation; Radar; System testing; Very large scale integration;
Conference_Titel :
Test Conference, 1992. Proceedings., International
Print_ISBN :
0-7803-0760-7
DOI :
10.1109/TEST.1992.527868
