• DocumentCode
    1659065
  • Title

    Feedback control of piezoelectric tube scanners

  • Author

    Tamer, Nabil ; Dahleh, Mohammed

  • Author_Institution
    Dept. of Mech. Eng., California Univ., Santa Barbara, CA, USA
  • Volume
    2
  • fYear
    1994
  • Firstpage
    1826
  • Abstract
    Piezoelectric tube actuators commonly used in scanning probe microscopes display undesirable properties including hysteresis, creep, and varying voltage sensitivity. The effects of these nonlinearities must be counteracted to produce distortion-free images, especially for large scanning ranges. Methods implemented by previous researchers include calibration of the scanner, postimaging software image correction, and real-time correction via feedback control. This article focuses on the last of these approaches by describing the design and experimental results of two feedback controllers for scanner motion
  • Keywords
    H control; atomic force microscopy; closed loop systems; control nonlinearities; control system synthesis; feedback; motion control; physical instrumentation control; piezoelectric devices; scanning tunnelling microscopy; creep; distortion-free images; feedback control; hysteresis; nonlinearities; piezoelectric tube actuators; piezoelectric tube scanners; scanner motion control; scanning probe microscopes; varying voltage sensitivity; Adaptive control; Calibration; Creep; Displays; Feedback control; Hysteresis; Microscopy; Piezoelectric actuators; Probes; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Decision and Control, 1994., Proceedings of the 33rd IEEE Conference on
  • Conference_Location
    Lake Buena Vista, FL
  • Print_ISBN
    0-7803-1968-0
  • Type

    conf

  • DOI
    10.1109/CDC.1994.411117
  • Filename
    411117