DocumentCode :
1659065
Title :
Feedback control of piezoelectric tube scanners
Author :
Tamer, Nabil ; Dahleh, Mohammed
Author_Institution :
Dept. of Mech. Eng., California Univ., Santa Barbara, CA, USA
Volume :
2
fYear :
1994
Firstpage :
1826
Abstract :
Piezoelectric tube actuators commonly used in scanning probe microscopes display undesirable properties including hysteresis, creep, and varying voltage sensitivity. The effects of these nonlinearities must be counteracted to produce distortion-free images, especially for large scanning ranges. Methods implemented by previous researchers include calibration of the scanner, postimaging software image correction, and real-time correction via feedback control. This article focuses on the last of these approaches by describing the design and experimental results of two feedback controllers for scanner motion
Keywords :
H control; atomic force microscopy; closed loop systems; control nonlinearities; control system synthesis; feedback; motion control; physical instrumentation control; piezoelectric devices; scanning tunnelling microscopy; creep; distortion-free images; feedback control; hysteresis; nonlinearities; piezoelectric tube actuators; piezoelectric tube scanners; scanner motion control; scanning probe microscopes; varying voltage sensitivity; Adaptive control; Calibration; Creep; Displays; Feedback control; Hysteresis; Microscopy; Piezoelectric actuators; Probes; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Decision and Control, 1994., Proceedings of the 33rd IEEE Conference on
Conference_Location :
Lake Buena Vista, FL
Print_ISBN :
0-7803-1968-0
Type :
conf
DOI :
10.1109/CDC.1994.411117
Filename :
411117
Link To Document :
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