DocumentCode
1659065
Title
Feedback control of piezoelectric tube scanners
Author
Tamer, Nabil ; Dahleh, Mohammed
Author_Institution
Dept. of Mech. Eng., California Univ., Santa Barbara, CA, USA
Volume
2
fYear
1994
Firstpage
1826
Abstract
Piezoelectric tube actuators commonly used in scanning probe microscopes display undesirable properties including hysteresis, creep, and varying voltage sensitivity. The effects of these nonlinearities must be counteracted to produce distortion-free images, especially for large scanning ranges. Methods implemented by previous researchers include calibration of the scanner, postimaging software image correction, and real-time correction via feedback control. This article focuses on the last of these approaches by describing the design and experimental results of two feedback controllers for scanner motion
Keywords
H∞ control; atomic force microscopy; closed loop systems; control nonlinearities; control system synthesis; feedback; motion control; physical instrumentation control; piezoelectric devices; scanning tunnelling microscopy; creep; distortion-free images; feedback control; hysteresis; nonlinearities; piezoelectric tube actuators; piezoelectric tube scanners; scanner motion control; scanning probe microscopes; varying voltage sensitivity; Adaptive control; Calibration; Creep; Displays; Feedback control; Hysteresis; Microscopy; Piezoelectric actuators; Probes; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Decision and Control, 1994., Proceedings of the 33rd IEEE Conference on
Conference_Location
Lake Buena Vista, FL
Print_ISBN
0-7803-1968-0
Type
conf
DOI
10.1109/CDC.1994.411117
Filename
411117
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