Title :
Measurement of plano-convex SC quartz blanks using lateral field excitation
Author_Institution :
Frequency Electron., Mitchel Field, NY, USA
Abstract :
The author addresses precision measurements of quartz crystal blanks before the electrodes are applied, which is advantageous in the production of crystal units excited by a lateral field. He discusses the use of a flat, lateral field jig. The precision is further enhanced by chemical polishing, which preserves the flatness and orientation of the lapped or ground quartz plates. The same jig can be used to identify unwanted or satellite resonant modes
Keywords :
crystal resonators; electron device manufacture; frequency measurement; polishing; production testing; chemical polishing; crystal units; electron device manufacture; flatness; ground quartz plates; lateral field excitation; lateral field jig; orientation; plano-convex SC quartz blanks; satellite resonant modes; Chemicals; Electric resistance; Electrodes; Etching; Frequency measurement; Production; Resonance; Resonant frequency; Satellites; Temperature;
Conference_Titel :
Frequency Control Symposium, 1988., Proceedings of the 42nd Annual
Conference_Location :
Baltimore, MD
DOI :
10.1109/FREQ.1988.27602
