Title :
Systems Testing: The Future for All of Us
Author :
Hawkins, Charles F.
Keywords :
Concurrent engineering; Design engineering; Design for testability; Electronic equipment testing; Integrated circuit testing; Manufacturing; Multichip modules; Performance evaluation; System testing; Systems engineering and theory;
Conference_Titel :
Test Conference, 1992. Proceedings., International
Print_ISBN :
0-7803-0760-7
DOI :
10.1109/TEST.1992.527869
