• DocumentCode
    16593
  • Title

    Investigation of RF Avalanche Inductive Effect on Reduction of Intermodulation Distortion of MOSFETs Using Volterra Series Analysis

  • Author

    Chie-In Lee ; Wei-Cheng Lin ; Yan-Tin Lin ; Bo-Siang Yang

  • Author_Institution
    Dept. of Electr. Eng. & Inst. of Commun. Eng., Nat. Sun Yat-Sen Univ., Kaohsiung, Taiwan
  • Volume
    63
  • Issue
    2
  • fYear
    2015
  • fDate
    Feb. 2015
  • Firstpage
    367
  • Lastpage
    373
  • Abstract
    In this paper, reduction of intermodulation distortion (IMD) due to inductive behavior for radio frequency (RF) MOSFETs is explored using Volterra series based on a nonlinear model incorporating a physical inductive breakdown network for the first time. The calculated total magnitude of high-order nonlinearities is lower than individual results from a nonlinear transconductance and breakdown inductance. In addition, the analysis result shows that the phase difference between the nonlinear transconductance and the breakdown inductance is almost π. Cancellation between resistive nonlinearity and reactive nonlinearity from the inductance due to the avalanche delay is first reported. The input third-order intercept point (IIP 3) is improved at biases where the breakdown inductance nonlinearity dominates. Instead, linearity will decrease when the breakdown resistance dominates.
  • Keywords
    MOSFET; Volterra series; avalanche breakdown; intermodulation distortion; semiconductor device breakdown; RF avalanche inductive effect; Volterra series analysis; breakdown inductance nonlinearity; breakdown resistance; inductive breakdown network; input third-order intercept point; intermodulation distortion reduction; nonlinear transconductance; phase difference; radio frequency MOSFETs; Delays; Electric breakdown; Integrated circuit modeling; Linearity; MOSFET; Radio frequency; Semiconductor device modeling; Breakdown; MOSFETs; Volterra series; intermodulation distortion; nonlinearity cancellation;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/TMTT.2014.2387273
  • Filename
    7008527