Title :
Automatic detection of visual defects in image intensifiers
Author :
Kamalapriya, M. ; Thilagavathi, V.
Author_Institution :
Central Res. Lab., Bharat Electron., Bangalore, India
Abstract :
Visible defects in Night Vision (NVD) Device images can act as visual distractions and may be large enough to mask critical information of normal night vision operations. In this paper we present a new method for detection of visual defects which will in turn help in the evaluation of Micro Channel Plate used in image intensifiers. The proposed method adopts a hybrid scheme using Circular Hough Transform and Shape classifier with Connected Component Analysis. The statistical and geometrical properties over a connected region of boundaries are explored for the purpose of defect detection. The performance is evaluated based on the noise withstanding capability of the algorithm.
Keywords :
Hough transforms; image classification; night vision; statistical analysis; circular Hough transform; connected component analysis; geometrical property; image intensifier; micro channel plate evaluation; night vision device image; normal night vision operation; shape classifier; statistical property; visual defect detection; visual distraction; Cathodes; Image edge detection; Image intensifiers; Noise; Shape; Transforms; Visualization; Circular Hough Transform (CHT); Connected Component Analysis (CCA); Micro Channel Plate (MCP); Night Vision Device (NVD);
Conference_Titel :
Communications (NCC), 2012 National Conference on
Conference_Location :
Kharagpur
Print_ISBN :
978-1-4673-0815-1
DOI :
10.1109/NCC.2012.6176796