X-ray topographic study of vacuum swept quartz crystals [frequency standards application]

Author

Zarka, A. ; Sebastian, M.T. ; Capelle, B.

Author_Institution

Lab. de Mineral. et Cristallographie, Univ. Pierre et Marie Curie, Paris, France

fYear

1988

Firstpage

208

Lastpage

210

Abstract

The presence of an unusual X-ray topographic contrast in vacuum-swept α-quartz crystals, which disappears on prolonged X-irradiation, is reported. It is shown that electrodiffusion of impurity ions leads to the accumulation of negative charges near the anode side of the crystals. This results in a strained crystal lattice which gives a strong X-ray topographic contrast near the anode side of the crystal. During irradiation of such crystals the negative charges created are neutralized by the formation of Al-hole and Al-OH centers

Keywords

OH^--centres; V-centres; X-ray applications; X-ray crystallography; X-ray diffraction examination of materials; X-ray effects; crystal atomic structure of inorganic compounds; crystal resonators; frequency measurement; measurement standards; quartz; surface topography measurement; Al₂O₃; SiO₂:Al,OH; X-ray crystallography; X-ray topographic contrast; electrodiffusion; impurity ions; irradiation; negative charges; strained crystal lattice; vacuum swept quartz crystals; Aluminum; Anodes; Cathodes; Crystals; Frequency; Impurities; Lattices; Oscillators; Production; Silicon;

fLanguage

English

Publisher

ieee

Conference_Titel

Frequency Control Symposium, 1988., Proceedings of the 42nd Annual

Conference_Location

Baltimore, MD

Type

conf

DOI

10.1109/FREQ.1988.27604

Filename

27604