DocumentCode :
1660073
Title :
X-ray emission above 10 keV from focused discharges (calorimetry and time-resolved monitoring)
Author :
Bortolotti ; Dare, Anne ; Mezzetti, F. ; Nardi ; Powell, Courtney
Author_Institution :
Ferrara Univ., Italy
fYear :
1998
Firstpage :
297
Abstract :
Summary form only given, as follows. Two issues are addressed: [1] The location of the source of hard X-rays (/spl ges/10 keV) in MA focused discharges. [2] The debated correlation of the deuterium-plasma reaction yield with the absolute intensity in different spectral region of the X-ray emission. Correlation, or the lack of it, can be observed when (a) different spectral regions, and/or (b) different source locations in the discharge vessel, are monitored. The hard component emission up to /spl sime/100 keV is recorded by using differential filters. Energy per pulse (kJ) and emitted power (TW) are monitored with filter-fitted calorimeters and with fast scintillation detectors (NE-102). Emission scaling tests utilized two plasma focus machines with Mather´s type electrodes hollow anode (APE-10, W/spl sime/7 kJ, an APF-50, W/spl ges/20 kJ). Different emission levels from a series of discharges with D/sub 2/ filling and with D/sub 2/+Ar fillings (Ar partial pressure from 2% to 16%) contribute to discriminating plasma pinch emission from anode emission. X-ray collimators designed for the same purpose establish the cogency of data analysis and of conclusions.
Keywords :
X-ray production; calorimetry; discharges (electric); plasma diagnostics; plasma focus; 10 keV; 100 keV; 20 kJ; 7 kJ; Ar; Ar partial pressure; D/sub 2/; D/sub 2/-Ar; D/sub 2/-plasma reaction yield; MA focused discharges; Mather´s type electrodes hollow anode; X-ray collimators; X-ray emission; anode emission; calorimetry; differential filters; emission scaling tests; fast scintillation detectors; filter-fitted calorimeters; focused discharges; hard X-rays source; hard component emission; plasma pinch emission; time-resolved monitoring; Anodes; Calorimetry; Fault location; Filling; Filters; Monitoring; Plasma sources; Position measurement; Scintillation counters; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Plasma Science, 1998. 25th Anniversary. IEEE Conference Record - Abstracts. 1998 IEEE International on
Conference_Location :
Raleigh, NC, USA
ISSN :
0730-9244
Print_ISBN :
0-7803-4792-7
Type :
conf
DOI :
10.1109/PLASMA.1998.677900
Filename :
677900
Link To Document :
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