Title :
A special march test to detect delay coupling faults for RAMs
Author :
Azimane, Mohamed ; Ruiz, Antonio Lloris
Author_Institution :
ED&T/Test, Philips Res. Lab., Eindhoven, Netherlands
fDate :
6/23/1905 12:00:00 AM
Abstract :
This paper introduces the idea of the delay coupling faults between the memory cells and also shows a new method to integrate a test for them within march tests. March tests do not cover delay coupling faults, moreover, the correct sensitizing operation sequences are not sufficient to cover them because of the large propagation time required to affect the content of the coupled cell. To cover the delay coupling faults, a special test based on the idea of the logic state of the memory array is presented. The new and more efficient march test, called DITEC+, proves to be efficient to cover the delay coupling faults
Keywords :
delays; fault diagnosis; integrated circuit testing; integrated memory circuits; random-access storage; DITEC+ test; RAM testing; coupled cell; delay coupling faults; fault coverage; logic state; march tests; memory array; memory cells; propagation time; simulation process; Computational modeling; Decoding; Delay effects; Fault detection; Laboratories; Logic arrays; Logic testing; Propagation delay; Random access memory; Read-write memory;
Conference_Titel :
Electronics, Circuits and Systems, 2001. ICECS 2001. The 8th IEEE International Conference on
Print_ISBN :
0-7803-7057-0
DOI :
10.1109/ICECS.2001.957641
