Non-robust delay test pattern generation based on stuck-at TPG

An approach to generate test pattern for the path delay fault model using a modified stuck-at TPG tool which has been used for industrial purposes for years is presented. We discuss constraints derived by the definition of non-robust delay tests and show that, under some circumstances, the requirements accepted in literature are not sufficient to derive non-robust tests due to possible test invalidation, even in the absence of any additional faulty delay. Finally, we discuss possible constraints which have influence on the test quality and show that test generation for robust tests can not be tackled if a stuck-at TPG tool is used without any delay fault simulation