Title :
An efficient hardware-based fault diagnosis scheme for AES: performances and cost
Author :
Bertoni, Guido ; Breveglieri, Luca ; Koren, Israel ; Maistri, Paolo
Author_Institution :
STMicroelectronics, Milano, Italy
Abstract :
Since standardization in 2001, the Advanced Encryption Standard has been the subject of many research efforts, aimed at developing efficient hardware implementations with reduced area and latency. So far, reliability has not been considered a primary objective. Recently, several error detecting schemes have been proposed in order to provide some defense against hardware faults in AES. The benefits of such schemes are twofold: avoiding wrong outputs when benign hardware faults occur, and preventing the collection of information about the secret key through malicious injection of faults. In this paper, we present a complete scheme for parity-based fault detection in a hardware implementation of the Advanced Encryption Standard which includes a key schedule unit. We also provide a preliminary evaluation of the hardware and latency overhead of the proposed scheme.
Keywords :
circuit reliability; cryptography; error detection codes; fault simulation; parity check codes; AES hardware implementations; advanced encryption standard; error detection; fault detection; hardware faults; hardware-based fault diagnosis; key schedule unit; latency overhead; malicious fault injection; parity code; parity-based fault detection; reliability; simulated fault injection; Computer architecture; Costs; Cryptography; Delay; Fault detection; Fault diagnosis; Field programmable gate arrays; Hardware; Scheduling; Throughput;
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems, 2004. DFT 2004. Proceedings. 19th IEEE International Symposium on
Print_ISBN :
0-7695-2241-6
DOI :
10.1109/DFTVS.2004.1347833